Skip to main content

Small angle X-ray scattering (SAXS)

Inspect nano-scale materials for shape and structure

International Union of CrystallographySmall-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nano-scale density differences in a sample can be quantified. This means that it can determine nano-particle size distributions, resolve the size and shape of (mono-disperse) macro-molecules, determine pore sizes, characteristic distances of partially ordered materials, and much more. This is achieved by analyzing the elastic scattering behavior of X-rays when traveling through the material, recording their scattering at small angles (typically 0.1 - 10°). SAXS is used for the determination of the microscale or nanoscale structure of particle systems in terms of such parameters as averaged particle sizes, shapes, distribution, and surface-to-volume ratio. The materials can be solid or liquid and they can contain solid, liquid or gaseous domains (so-called particles) of the same or another material in any combination. Not only particles, but also the structure of ordered systems like lamellae, and fractal-like materials can be studied. The method is accurate, non-destructive and usually requires only a minimum of sample preparation. Applications are very broad and include colloids of all types, metals, cement, oil, polymers, plastics, proteins, foods and pharmaceuticals and can be found in research as well as in quality control.

SAXS

Explore the products Rigaku recommends for the following techniques:

  • Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

  • Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

  • High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

  • World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm

  • Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources

  • Small angle X-ray scattering (SAXS) Kratky camera system

  • Small and wide angle X-ray scattering instrument designed for nano-structure analyses

  • Small and wide angle X-ray scattering instrument designed for nano-structure analyses

  • A modernized 2D Kratky system that eliminates data corrections required of traditional systems