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SmartLab training (Europe)

Basic Training Course for SmartLab (RESE)
Course Name:   Basic Training Course for SmartLab
Duration:   5-days
Sessions:   2-6 March, 2020
23-27 March, 2020
3-7 August, 2020
23-27 November, 2020
Course Times:   9 a.m. – 5 p.m.
Location:   Rigaku Europe SE, European Center of Expertise
Hugenottenallee 167, 63263 Neu-Isenburg,
Germany

 

General Scope

This course addresses the basic operations in terms of hardware and software for the SmartLab multi-purpose XRD instrument. The training is based on hands-on solving of example problems in order to illustrate a range of XRD techniques. Starting from basic general purpose powder X-ray diffraction right through to pole figure, residual stress, SAXS and thin-film X-ray diffraction including X-ray reflectivity, grazing incidence diffraction, in-plane diffraction and high-resolution diffraction using PDXL, 3D Explore and Global Fit software. Previous experience in X-ray diffraction is required. Persons attending the training should expect to leave the course with a basic working knowledge of both the SmartLab hardware and analysis software. Some of the specific topics covered are outlined below.

Rigaku will provide the training venue, printed training notes, light refreshment and a course certificate.

Persons attending the training are strongly advised to bring their own personal computer with software installation and software dongle that is required to run the software.

Who Should Attend

Operators, engineers, research scientists and university students in university and operators of the SmartLab diffractometer supplied by Rigaku.

Course Agenda

Day 1

Introduction RESE and participants
XRD basics and First look - SmartLab
"Hands on SmartLab" practical usage
Part 1 / Alignment and Powder diffraction BB, PB, Sample preparation
Part 2 / HyPix-3000 vs. D/teX, K beta Filter, XRF reduction mode

Day 2

Hands on SmartLab Studio II"
Basic package, Qualitative phase analysis
WPPF – Introduction to Rietveld method
Quantitative analysis, Methods for phase quantification
Quantification of amorphous phases
Comprehensive Analysis
Crystallite size distribution
Structure determination
Direct Derivation method

Day 3: (training class will be split in two parallel sessions)

Session 1:
"Hands on SmartLab" practical usage
Part 3 / Reflection and transmission geometry
Part 4 /Grazing Incident Diffraction, optimization of measurement conditions
Part 5 /SAXS/USAXS
Session 2:
"Hands on SmartLab" practical usage
Part 6 / Residual Stress / Theory, measurement conditions and analysis of measured data with SmartLab Studio II
Pole Figure measurements of Al /Theory, measurement conditions and analysis of measured data with SmartLab Studio II

Day 4:

Powder XRD with 2D detector
Part 7 / 2DSAXS/WAXS -Theory and measurements condition
Part 8 / Measurements in scanning mode, data processing
Part 9 / Measurements in static mode
Part 10 / Measurements and data processing
Part 11 / Measurements in scanning mode, data processing
Part 12 / Measurements in static mode
Part 13 / Measurements and data processing
Thin Film XRD with 2D detector
Part 14 / 2D-GISAXS -Theory and measurements condition
Part 15 / 2D-GISAXS data processing
Wide-range RSM with 2D detector
Part 16 /Measurements and data processing
In-plane diffraction
Part 17 /Measurements and data processing

Day 5: (training class will be split in two parallel sessions)

Session 1:
"Hands on SmartLab" practical usage/ High-temperature measurements
Session 2:
Thin Film
Part 18 – In-plane vs. Grazing incidence diffraction
Part 19 – XRR
Part 20 – XRR Data analysis with SmartLab Studio II software
Part 21 – HR-XRD
Part 22 – HR-XRD Data analysis with SmartLab Studio II software

Common discussions. Summary of the training.

Note: During training course, the latest version of software for instrument control and analysis software that is available on the market is used. Therefore, details of the operation might be different from your environment. Our trainers are available to discuss the operations on your version of the software. In such a case, you are advised to bring your personal computer with software installation and software dongles along with you.

Please, note, our application scientists are available for discussions or demonstrations of other Rigaku products, e.g. SMX XRD systems or XRF spectrometers, therefore please let us know in advance to schedule these appointments in case of interest.