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Metals and alloys

Elemental, phase and residual stress analysis

Foundries, smelters and mills, as well as other aspects of the metals industry, are characterized by having continuous production demanding day and night control of both the process and the quality of incoming and outgoing materials. X-ray fluorescence (XRF) analysis plays a dominant role in controlling the production processes within these industries. The speed and precision of XRF make it a preferred testing method where high throughput chemical analysis is required to support the production process. In addition to alloy stoichiometry, another important characteristic of metals is residual stress which is correlated with structural failure. X-ray diffraction (XRD) is the only accurate way to measure residual stress non-destructively. XRD offers non-contact measurements with unsurpassed spatial resolution and the ability to measure phases in metals.

Rigaku also offers a laser-induced breakdown spectroscopy (LIBS) handheld product, the Katana. LIBS is a type of atomic emission spectroscopy which uses a highly energetic laser pulse as the excitation source. The laser is focused to form a plasma, which atomizes and excites samples that then emit characteristic spectra for the elements in the sample.

Metals and alloys

Rigaku recommends the following systems:


  • Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

  • Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification

  • High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

  • High power, tube above, sequential WDXRF spectrometer

  • High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

  • Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

  • New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

  • New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

  • EDXRF spectrometer with powerful Windows® software and optional FP.

  • High-speed, stationary sample microtomography of large samples

  • High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

  • EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)

  • The world’s smallest portable stress analyzer that is specifically designed for field analysis

  • Compact two dimensional (2D) X-ray sCMOS camera for use in micron and submicron applications

Application notes

The following application notes are relevant to this industry