Elemental / phase analysis to molecular structure
Governments and industry collectively invest billions of dollars every year into the research and development of advanced materials. This work involves study of the characteristics and uses of various substances, such as metals, ceramics, and plastics, that are employed in applications ranging from space science and defense technology to consumer products. X-ray diffraction (XRD) is a primary technique for the study of advanced materials, including investigation of the following properties: identification and quantification of phases, determination of the degree of crystallinity in phases, crystallographic structure, crystal orientation and texture, residual stress analysis, thin film thickness and properties, pore sizes, as well as much more. The influence of non-ambient conditions on these properties is also routinely studied with the XRD technique. Investigations may be carried out on samples of varying types, from powders, to solid materials of varying shapes and size, to solutions and semiconductor wafers. Rigaku technology and expertise provide a number of unique solutions for materials science applications.
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab.
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.
An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples
Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm
Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
User-inspired data collection and data processing software for small molecule and protein crystallography.
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube above, sequential WDXRF spectrometer
WDXRF spectrometer designed to handle very large and/or heavy samples
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components
High-speed, stationary sample microtomography of large samples
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
TG-DTA is a hyphenated technology composed of simultaneous thermal analysis (STA).
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Compact, highly sensitive X-ray detector for single crystal applications
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
TMA is the measurement of a change of a dimension or a mechanical property of the sample while it is subjected to a temperature regime.
DSC is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature.
Thermodilatometry (TDL) is a thermal analysis technique in which a constant load is applied to a sample, and the amount of expansion and/or shrinkage of the sample is measured during heating.
TMA/HUM measures change of a dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.
Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry through an interface system. This technique is suitable for the qualitative analysis of gases evolved in response to a heated sample
The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.