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Geology and minerals

Phase, elemental and chemical analysis

In studying planetary processes and makeup of the Earth, geologists routinely analyze the composition and molecular structure of rock and mineral samples. Long having been central tools in geological research, X-ray analytical techniques have become more powerful with small spot excitation, mapping, and standardless quantitative analysis. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials. The latest generation of wavelength dispersive XRF instrumentation employs a small analyzing area and an XY-stage to automatically make multiple measurements of a sample to produce a chemical composition map. X-ray diffraction (XRD) is employed to quantitatively measure phase composition. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. Rigaku technology and expertise provide a number of unique solutions for these determinations.

Geology

Rigaku recommends the following systems:


  • Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

  • Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab.

  • New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

  • Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

  • A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.

  • An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples

  • Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator

  • High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

  • World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm

  • User-inspired data collection and data processing software for small molecule and protein crystallography.

  • High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

  • High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

  • High power, tube above, sequential WDXRF spectrometer

  • New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

  • New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

  • Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components

  • High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

  • 2D X-ray detector with latest semiconductor technology designed for home lab diffractometers

  • Compact, highly sensitive X-ray detector for single crystal applications

Application notes

The following application notes are relevant to this industry