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Food and food ingredients

Food and food ingredients

The need for chemical analysis of food and cosmetics has increased in recent years. Increased emphasis in industry, and by government, on safety, efficacy and content labeling are the core drivers. Near line monitoring during the production process also affords long-term cost savings from decreased waste, rework and materials costs. The United States (FDA), European Union and various other regulatory bodies around the world strictly regulate the allowable concentrations of heavy metal contaminants in foodstuffs, drugs and cosmetics. In addition, much commercial food production requires careful monitoring of salt concentrations to ensure correct flavor characteristics. Cosmetics that use metal oxides for sunscreen protection factor (SPF) enhancement must have 100% quality inspection to meet U.S. over-the counter (OTC) pharmaceutical regulations. Packaging must also be monitored for contaminates that may leach into products.

Rigaku recommends the following systems:


Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-speed, stationary sample microtomography of large samples

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

Ultra-high resolution nanotomography using parallel beam geometry

Scanning multi-element process coatings analyzers for web or coil applications

High-resolution benchtop microtomography of large samples