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Rigaku Products by Industry

Explore the products Rigaku recommends for the following industries:

Chemistry

To aid in the understanding of certain aspects of chemistry, Rigaku makes a range of X-ray fluorescence (XRF for elemental analysis) and X-ray diffraction (XRD for phase and structural analysis) instruments for both academic research and industrial applications.

Education

We are the only provider of a complete line of benchtop X-ray analytical products—providing affordable and easy-to-use solutions for small molecule single crystal diffraction, general purpose X-ray diffraction (XRD), and X-ray fluorescence (XRF).

Forensics and conservation

Rigaku's Raman spectrometers are perfect for chemical or organic materials identification in the lab or in the field. Small spot XRF is a non-destructive method that can identify and quantify a vast number of atomic elements. X-ray diffraction (XRD) can identify chemical phases in complete unknowns.

Geology and minerals

XRF is the key technique for characterizing the element composition of geological materials. X-ray diffraction is employed to quantitatively measure phase composition. Rigaku technology and expertise provide a number of unique solutions for these determinations.

Materials science

XRD is a primary technique for the study of advanced materials, including identification and quantification of phases, determination of the degree of crystallinity in phases, crystallographic structure, crystal orientation and texture, residual stress analysis, thin film thickness and properties, and pore sizes.

Pharmaceuticals

X-ray powder diffraction is extensively used in the drug discovery, design, development and formulation processes to obtain critical knowledge about pharmaceutical products. Rigaku products range from crystal diffraction screening and high-resolution data collection systems to 3D structure refinement and imaging software.

Photovoltaics

XRF is used to measure the thickness and composition of metal-containing thin-film layers as part of production process control. XRD and X-ray reflectometry (XRR) are used in R&D to characterize layer properties like roughness, density, porosity, and crystal structure.

Process control

Rigaku process stream EDXRF analyzers measure sulfur, and other elements from Al to U, in near real time. Our coil/web analyzers provide cross web and down web profiling of coating weight thickness and composition.

Safety & Security

Safety and security threat analysis continuously evolves as threats continue to emerge. First responders, law enforcement professionals, customs agencies, and the military play a critical role in protecting communities. Whether...