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XRF products from Rigaku

  • WDXRF ultra low sulfur analyzer for method ASTM D2622

  • Tube below, single element WDXRF analyzer for quality control applications

  • ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

  • The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer

  • High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

  • New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

  • New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

  • Scanning multi-element process coatings analyzers for web or coil applications

  • EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)

  • Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

  • Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

  • EDXRF spectrometer with powerful Windows® software and optional FP.

  • High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

  • Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

  • Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

  • Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.