Process energy dispersive X-ray fluorescence analyzer
Real-time, on-line process elemental analysis
- Real-time process control by elemental analysis
- Measure elements aluminum (₁₃Al) to uranium (₉₂U)
- From ppm levels to weight percent (wt%) concentrations
- Robust Rigaku NEX QC+ optical kernel with SDD detector
- Industrial touch screen user interface
- Easy empirical calibration and routine operation
- Routine maintenance typically requires no tools
- Multiple remote analysis heads for non-classifi ed areas
- No dangerous radioisotopes
Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is configurable for use in both classified and non-classified areas.
Analyze from aluminum (₁₃Al) to uranium (₉₂U)
To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX QC+ high resolution benchtop instrument. With this proven technology, the Rigaku NEX OL delivers rapid, non-destructive, multi-element analyses – from parts-per-million (ppm) levels to high weight percent (wt%) concentrations – for elements from aluminum through uranium. Equipped with a 50 kV X-ray tube and SDD detector – together with a standardized, optimized suite of tube filters – the Rigaku NEX OL is engineered to solve a broad range of process control applications.
Unique tool-less flow cell design
For the elemental analysis of liquid streams, an analyzing head is mated to a unique tool-less flow cell assembly incorporating the X-ray window. The X-ray window contains the liquid stream but is transparent to X-rays; it is typically a plastic film.
Coating thickness and composition
In addition to analyzing liquid streams, the Rigaku NEX OL is designed to service web and coil applications, with the ability to perform multi-element composition and/or coating thickness. Typically a head is mounted in a fixed position over a roller so that the head to surface distance is constant.
|Product name||NEX OL|
|Technique||X-ray fluorescence (XRF)|
|Benefit||Real time, on-line elemental analysis of Al through U|
|Technology||Process energy dispersive XRF|
|Core attributes||50 kV, 4 W X-ray tube, SDD detector, tool-less flow cell design (liquids), fixed head for coating thickness and composition|
|Core options||Varies by configuration|
|Computer||Internal PC, embedded Linux OS, NEX OL software|
|Core dimensions||Varies by configuration|
|Mass||Varies by configuration|
|Power requirements||1Ø, 110/240 VAC, 2.5/1.5 A, 47-63 Hz|