Versatile dual wavelength X-ray diffractometer with HPC X-ray detector
A multi-functional single crystal X-ray diffractometer for a wide range of crystallographic applications
- Access to two wavelengths in one compact system
- 12x higher flux than sealed tube X-ray sources
- Low maintenance, high performance system
- Uses CrysAlisPro software with both PX and SMX modes
One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.
The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced. Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.
- Multi-functional diffractometer to cover you wherever your research takes you
- High flux performance means you all your crystallography needs can be carried out ‘in-house’
- Very little downtime and easy maintenance
- No need to purchase extra software for different applications
|Product name||XtaLAB Synergy-DW|
|Technique||Single crystal X-ray diffraction|
|Benefit||Fast structural analyses of a wide range of single crystals|
|Technology||Dual wavelength X-ray diffractometer|
|Core attributes||X-ray diffractometer with high-flux, dual wavelength X-ray source, kappa goniometer and HPC detector|
|Core options||Oxford Cryostream cooler, XtalCheck-S|
|Computer||External PC, MS Windows® OS, CrysAlisPro Software|
|Core dimensions||1300 (W) x 1875 (H) x 850 (D) (mm)|
|Mass||600 kg (core unit)|
|Power requirements||1Ø, 200-230 V, 20 A|
The ELement ANalyzer is a state-of-the-art attachment that allows us to obtain qualitative information on elements in a single crystal at the same time as X-ray diffraction data collection for a single crystal structural analysis. By measuring the X-ray fluorescence spectrum emitted during X-ray diffraction experiments with the ELement ANalyzer, it becomes possible to perform elemental analysis on a single grain of crystal. The ELement ANalyzer can be used for confirmation the presence of central metal(s) in a mononuclear or polynuclear complex or solvent in a crystal for small molecule X-ray crystallography. There is a broad range of possible applications of the ELement ANalyzer in scientific fields.
The Oxford Cobra is the non-liquid nitrogen Cryostream. Combining the efficiency of a Cryostream with the advantages of a non-liquid system, the Cobra offers the ultimate solution for both macromolecular and small molecule crystallography.
The 800 Series Cryostream is the most robust, efficient and user-friendly liquid nitrogen based low temperature system available today. Specific features include a superior laminar flow system, meaning virtually zero risk of icing, extremely quiet running and a fast-start system resulting in a cool-down time to 100K of just 20 minutes.
The XtalCheck system includes software that facilitates both visual and diffraction imaging of crystallization experiments. With the XtalCheck system, one can easily survey many crystallization experiments by eliminating the need to harvest and cryo-cool samples. Moreover, one can perform serial crystallography experiments, by collecting data from multiple crystals, to achieve complete data sets that can be used for structure solution.