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Polymers, plastics & rubber

Elements, phases and particle sizes to molecular structure

For all tasks in polymer research, product development, and production quality control, X-ray fluorescence (XRF) analysis can identify and quantify the concentrations of additives (pigments, fillers, flame retardants, stabilizers) like antimony, barium, bromium, calcium, chromium (for the RoHS/WEEE regulations), copper, phosphorus, titanium or zinc.

In addition, many plastic polymers have some order and can be identified and studied by X-ray diffraction (XRD) methods. These polymers are, at least in part, crystalline or pseudo-crystalline with partially ordered structures which cause diffraction peaks. The percent crystallinity is often related to processing methods and is of great importance in polymer chemistry. Other uses of XRD in plastics and polymers research and production include: determination of unit cell type and lattice parameters, determination of the microstructure, and determination of crystallographic orientation through pole figures.

Polymers can also be investigated by small angle X-ray scattering (SAXS). Either dissolved or as a solid, the SAXS technique can characterize polymers according to large-scale internal structure. Rigaku technology and expertise are combined to provide a number of X-ray analytical products for these applications.

Polymers, plastics and rubber

Rigaku recommends the following systems:

  • Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

  • New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

  • Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

  • High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

  • High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

  • High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

  • High power, tube above, sequential WDXRF spectrometer

  • Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

  • Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

  • New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

  • New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

  • EDXRF spectrometer with powerful Windows® software and optional FP.

  • Small and wide angle X-ray scattering instrument designed for nano-structure analyses

  • High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

  • Ultra-high resolution nanotomography using parallel beam geometry

  • EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)

  • TG-DTA is a hyphenated technology composed of simultaneous thermal analysis (STA).



  • A modernized 2D Kratky system that eliminates data corrections required of traditional systems

Application notes

The following application notes are relevant to this industry