Rigaku makes X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation for material characterization and element analysis at every stage of the exploration, production and distribution process, such as for sulfur analysis and other elements in crude oil and fuels. Rigaku instruments comply with the relevant measurement protocols, including ASTM D2622, D7220, D4294, and IP 532, as well as EN ISO 8754 & 20847. The Rigaku NEX XT process analyzer is used for on-line measurement of sulfur for pipeline, blending and upgrading, as well as bunker fuel blending for MARPOL compliance and additive packages for lubricating oils.
X-ray topography (XRT)
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube above, sequential WDXRF spectrometer
WDXRF ultra low sulfur analyzer for method ASTM D2622
ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD
Tube below, single element WDXRF analyzer for quality control applications
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
WDXRF ultralow chlorine analyzer
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
High-resolution benchtop microtomography of large samples