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Elemental Analysis

Measure almost any element in almost any matrix

X-ray fluorescence (XRF) provides one of the simplest, most accurate and most economic analytical methods for the determination of elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique WDXRF products are routinely used to analyze products from cement to plastics and from metals to food to semiconductor wafers. Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop EDXRF and WDXRF systems. Rigaku also offers a laser-induced breakdown spectroscopy (LIBS) handheld product, the Katana. LIBS is a type of atomic emission spectroscopy which uses a highly energetic laser pulse as the excitation source. The laser is focused to form a plasma, which atomizes and excites samples that then emit characteristic spectra for the elements in the sample.

Elemental analysis

Rigaku recommends the following systems:


  • Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

  • High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

  • High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

  • High power, tube above, sequential WDXRF spectrometer

  • WDXRF spectrometer designed to handle very large and/or heavy samples

  • High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

  • Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

  • Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

  • New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

  • New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

  • EDXRF spectrometer with powerful Windows® software and optional FP.

  • High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

  • EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)

  • Scanning multi-element process coatings analyzers for web or coil applications

  • Tube below, single element WDXRF analyzer for quality control applications

  • The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer

Application notes

The following application notes are relevant to this industry