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Chemical / composition identification

Handheld Raman identifies chemical composition

Progeny ResQ 1064 nm handheld Raman provides emergency responders, law enforcement agencies and the military with the industry’s most comprehensive tool for chemical identification, CBRNe detection, and narcotics classification in a fast and simple handheld form. Faced with increasingly sophisticated chemical threats and global drug trafficking, Progeny ResQ provides users with confidence to: detect explosive threats quickly and accurately in harsh environments, identify a wide range of narcotics and illegal drugs, and respond to suspicious hazardous materials that risk public safety.

Commonly employed techniques to non-destructively determine the composition of an unknown sample are X-ray fluorescence (XRF) and X-ray diffraction (XRD). X-ray fluorescence provides elemental composition information for boron (B) through uranium (U) from parts-per-million (PPM) to percent (%) levels. Using fundamental parameters (FP) algorithms, XRF can provide quantitative analysis without the need for reference standards. X-ray diffraction provides phase composition identification and can distinguish the major, minor, and trace compounds present in a sample. XRD analysis includes the mineral name of the substance, chemical formula, crystalline system, and reference pattern number from the ICDD International database. Standardless quantitative information can also be obtained from XRD using Rietveld Analysis.

Composition identification

Rigaku recommends the following systems:


  • Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

  • New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

  • Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

  • Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

  • Provides the industry’s widest and most comprehensive range of raw material identification and finished product authentication in a handheld, sealed platform

  • High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

  • World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm

  • Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources

  • High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

  • High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

  • High power, tube above, sequential WDXRF spectrometer

  • WDXRF spectrometer designed to handle very large and/or heavy samples

  • New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

  • New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

  • EDXRF spectrometer with powerful Windows® software and optional FP.

  • Foreign object X-ray inspection instrument

  • 200 kV microcomputerized directional industrial X-ray system

  • High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

  • Foreign object X-ray inspection instrument

  • Foreign object X-ray inspection instrument